switching on a semiconductor switch of the plurality of parallel-connected semiconductor switches presently to be monitored of the plurality of parallel-connected semiconductor switches, while the other semiconductor switches of the plurality of parallel-connected semiconductor switches are switched off or become switched off;

subjecting the semiconductor switch to be monitored to a first predefined load current for a duration of a first predefined period of time;

detecting a first voltage drop across parallel-connected load paths of the plurality of semiconductor switches within the first period of time;

switching on all semiconductor switches of the plurality of parallel-connected semiconductor switches after termination of the first period of time;

subjecting the plurality of parallel-connected semiconductor switches to a predefined second load current for a duration of a predefined second period of time,

switching off all semiconductor switches not presently to be monitored of the plurality of parallel-connected semiconductor switches after termination of the second period of time;

subjecting the semiconductor switch to be monitored to the first predefined load current for a duration of a third predefined period of time;

detecting a second voltage drop across the parallel-connected load paths of the plurality of semiconductor switches within the third period of time;

ascertaining a change of at least one variable of the semiconductor switch to be monitored between the detection of the first voltage drop and the detection of the second voltage drop, the change being ascertained based on the first load current, the first voltage drop, the second load current, and the second voltage drop; and

ascertaining a state of the semiconductor switch to be monitored and/or an electronics packaging which corresponds to the semiconductor switch to be monitored, based on a deviation of the change of the at least one variable from a predefined reference value.