	US 12,235,318 B2
	Methods for determining and calibrating non-linearity in a Phase Interpolator and related devices and systems
Gunjan Mandal, Bengaluru (IN); Sunil Rajan, Bengaluru (IN); and Raghavendra Molthati, Bengaluru (IN)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Jul. 7, 2023, as Appl. No. 18/219,484.
Claims priority of application No. 202241039910 (IN), filed on Jul. 12, 2022.
Prior Publication US 2024/0044978 A1, Feb. 8, 2024
Int. Cl. G01R 31/00 (2006.01); G01R 23/20 (2006.01); G01R 31/317 (2006.01)

CPC G01R 31/31727 (2013.01) [G01R 23/20 (2013.01); G01R 31/3171 (2013.01)]

16 Claims

1. A method for determining non-linearity in a Phase Interpolator (PI) of a wire-line receiver, the method comprising:

determining a first jitter value causing a Bit Error Rate (BER) of a data sequence to exceed a predefined target BER when a recovered clock is aligned with the data sequence at a first PI code;

determining a second jitter value causing the BER of the data sequence to exceed the predefined target BER at a second PI code, wherein the first PI code is adjacent to the second PI code;

determining a Differential Non-Linearity (DNL) corresponding to the second PI code based on a phase shift introduced to the recovered clock by the second PI code relative to the first PI code, the first jitter value, and the second jitter value; and

calibrating the PI based on the determined DNL.