US 12,235,314 B2
Parallel test cell with self actuated sockets
Karthik Ranganathan, Foothill Ranch, CA (US); Gilberto Oseguera, Corona, CA (US); Gregory Cruzan, Anaheim, CA (US); Joe Koeth, San Jose, CA (US); Ikeda Hiroki, Kukishi Saitama (JP); and Kiyokawa Toshiyuki, Kukishi Saitama (JP)
Assigned to Advantest Test Solutions, Inc, San Jose, CA (US)
Filed by Advantest Test Solutions, Inc., San Jose, CA (US)
Filed on Jul. 29, 2022, as Appl. No. 17/877,660.
Claims priority of provisional application 63/244,145, filed on Sep. 14, 2021.
Prior Publication US 2023/0083634 A1, Mar. 16, 2023
Int. Cl. G01R 1/02 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/28 (2006.01)
CPC G01R 31/2834 (2013.01) [G01R 1/0441 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An automated test equipment (ATE) for testing devices under test (DUTs), the ATE comprising:
a test interface board assembly comprising:
a socket configured to provide electrical couplings from said test interface board assembly to a device under test (DUT),
wherein said socket is further configured to accept an active thermal interposer (ATI) device while said DUT is contemporaneously disposed in said socket, and
wherein said socket comprises a plurality of spring-loaded roller retention devices configured to retain one or more devices in said socket;
a Z-axis interface plate configured to open said plurality of spring-loaded roller retention devices to enable insertion of said DUT into said socket; and
an ATI placement plate configured to open said plurality of spring-loaded roller retention devices to enable insertion of said ATI device into said socket.