US 12,235,220 B2
Method of determining abnormality of display manufacturing facility
Jinwook Lee, Yongin-si (KR); Changyun Moon, Yongin-si (KR); and Hyunjoon Kim, Yongin-si (KR)
Assigned to SAMSUNG DISPLAY CO., LTD., Yongin-si (KR)
Filed by Samsung Display Co., Ltd., Yongin-si (KR)
Filed on Apr. 10, 2023, as Appl. No. 18/297,737.
Claims priority of application No. 10-2022-0087383 (KR), filed on Jul. 15, 2022.
Prior Publication US 2024/0011913 A1, Jan. 11, 2024
Int. Cl. G01N 21/88 (2006.01); G09G 3/00 (2006.01)
CPC G01N 21/88 (2013.01) [G09G 3/006 (2013.01); G09G 2360/145 (2013.01)] 6 Claims
OG exemplary drawing
 
1. A method of determining whether a display manufacturing facility is abnormal, the method comprising:
a first step of obtaining facility information data of facilities used to manufacture a display panel;
a second step of preparing a display module by attaching a printed circuit board and a driving chip to the display panel;
a third step of obtaining preliminary inspection data through an on-off test on the display module;
a fourth step of associating the facility information data with the preliminary inspection data;
establishing a database by repeatedly performing the first step to the fourth step;
obtaining real-time inspection data through an on-off test on a display module to be inspected;
determining, from the real-time inspection data, whether the display module to be inspected is normal; and,
determining a facility causing abnormality of the display module, from the real-time inspection data by using the database in case that the display module to be inspected is determined to be abnormal.