detecting, by the electronic device, a drop event comprising an impact of the electronic device with an impact surface;

measuring, by the electronic device, at least one motion parameter of the electronic device corresponding to the drop event; and

estimating, by the electronic device, the damage risk level for the drop event, based on the measured at least one motion parameter,

wherein estimating, by the electronic device, the damage risk level comprises:

classifying the impact surface into at least one surface type based on the measured at least one motion parameter, wherein the at least one surface type includes one of a hard surface type, a medium surface type, or a soft surface type; and

estimating the damage risk level for the drop event based on at least one of the classified surface type, the at least one motion parameter, and a usage history, wherein the usage history comprises information about a frequency of drops, a first surface on which the electronic device is dropped frequently, a plurality of drop heights, or a plurality of orientations of the electronic device before the impact with the impact surface,

wherein classifying the impact surface into the at least one surface type comprises:

measuring first acceleration data of the electronic device using at least one sensor at a first sampling rate, on detecting a freefall of the electronic device, wherein one or more acceleration data comprises the first acceleration data;

detecting the impact using the first acceleration data measured at the first sampling rate;

setting a second sampling rate, after the electronic device impacts the impact surface;

enabling a processor to measure second acceleration data of the electronic device using the at least one sensor at the second sampling rate, wherein the processor includes one of an Application Processor (AP), or a sensor hub, wherein the one or more acceleration data comprises the second acceleration data;

extracting at least one feature using the second acceleration data measured at the second sampling rate; and

processing, with a classifier model, the at least one feature to classify the impact surface as the at least one surface type.