US 12,235,168 B2
Methods and apparatus to trim temperature sensors
Nathan Richard Schemm, Rowlett, TX (US)
Assigned to TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed by TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed on Jun. 7, 2023, as Appl. No. 18/206,684.
Application 18/206,684 is a division of application No. 16/731,910, filed on Dec. 31, 2019, granted, now 11,698,307.
Claims priority of provisional application 62/955,564, filed on Dec. 31, 2019.
Prior Publication US 2023/0349774 A1, Nov. 2, 2023
Int. Cl. G01K 15/00 (2006.01); G01K 7/01 (2006.01); G01K 7/16 (2006.01); G05B 11/01 (2006.01); H01L 23/34 (2006.01)
CPC G01K 15/005 (2013.01) [G01K 7/16 (2013.01); G01K 15/007 (2013.01); G05B 11/018 (2013.01); H01L 23/34 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system comprising:
a first die including:
a temperature indicator including a resistance indicative of a temperature of a first transistor, wherein the first transistor includes a first channel of a first material; and
a second die including:
a first calibrator configured to be adjusted;
a first temperature sensor coupled to the first calibrator, the first temperature sensor configured to sample a value indicative of a temperature of a second transistor, wherein the second transistor includes a second channel of a second material;
a second calibrator configured to be adjusted; and
a second temperature sensor coupled to the second calibrator and the temperature indicator, the second temperature sensor configured to sample a second sample a value indicative of a temperature of the first die based on the temperature indicator.