US 12,234,554 B2
Semiconductor deposition reactor and components for reduced quartz devitrification
Rutvij Naik, Tempe, AZ (US); Junwei Su, Tempe, AZ (US); Wentao Wang, Chandler, AZ (US); Chuqin Zhou, Tempe, AZ (US); and Xing Lin, Chandler, AZ (US)
Assigned to ASM IP Holding B.V., Almere (NL)
Filed by ASM IP HOLDING B.V., Almere (NL)
Filed on Jun. 30, 2022, as Appl. No. 17/810,094.
Claims priority of provisional application 63/217,122, filed on Jun. 30, 2021.
Prior Publication US 2023/0002895 A1, Jan. 5, 2023
Int. Cl. C23C 16/458 (2006.01); C23C 16/455 (2006.01)
CPC C23C 16/4585 (2013.01) [C23C 16/455 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A chemical vapor deposition system comprising:
chamber boundaries defining a deposition chamber having a deposition gas inlet at an upstream end and a gas outlet at a downstream end, the chamber boundaries defining a generally horizontal chamber passage configured to conduct gas flow along a gas flow direction therethrough, the chamber boundaries comprising quartz;
a susceptor configured to support a substrate thereon, the chamber boundaries above the susceptor being generally transparent to radiation energy;
a susceptor support ring positioned in the chamber passage between the gas inlet and the gas outlet;
a getter plate positioned generally horizontally within the deposition chamber, the getter plate extending generally parallel to the susceptor and extending laterally substantially across the deposition chamber;
a getter support comprising a support base and one or more first support posts, at least a portion of the getter support and at least one of the one or more first support posts comprising a coating comprising silicon carbide (SiC), the getter support being disposed a maximum distance of between about 1 mm and about 10 mm from the susceptor support ring; and
a getter support shelf configured to be disposed on a generally horizontal chamber boundary and to at least partially support the getter support, wherein the getter support shelf comprises:
one or more second support posts configured to support the getter plate and extending between the getter support and the getter support shelf, and
one or more recesses in a face thereof, the one or more recesses configured to receive corresponding ones of the one or more second support posts.