US 12,232,903 B2
X-ray imaging apparatus
Han Sik Na, Gyeonggi-do (KR); and Da Hea Han, Gyeonggi-do (KR)
Assigned to VATECH Co., Ltd., Gyeonggi-do (KR); and VATECH EWOO Holdings Co., Ltd., Gyeonggi-do (KR)
Filed by VATECH Co., Ltd., Gyeonggi-do (KR); and VATECH EWOO Holdings Co., Ltd., Gyeonggi-do (KR)
Filed on Jun. 2, 2022, as Appl. No. 17/830,605.
Claims priority of application No. 10-2021-0072424 (KR), filed on Jun. 3, 2021; and application No. 10-2021-0076905 (KR), filed on Jun. 14, 2021.
Prior Publication US 2022/0386971 A1, Dec. 8, 2022
Int. Cl. A61B 6/51 (2024.01); A61B 6/00 (2024.01)
CPC A61B 6/51 (2024.01) [A61B 6/4452 (2013.01)] 6 Claims
OG exemplary drawing
 
1. An X-ray imaging apparatus configured to capture first and second X-ray images of an object, respectively, the X-ray imaging apparatus comprising:
an imaging part configured to comprise a generator and a detector facing each other with an object interposed therebetween, and rotate the generator and the detector about a rotation axis therebetween to capture each of the first and second X-ray images; and
an object alignment part configured to arrange the object between the generator and the detector,
wherein a position of at least a part of the object alignment part is variable, so as to move and align the object to a first alignment position for capturing the first X-ray image and a second alignment position for capturing the second X-ray image, respectively, and
wherein the X-ray imaging apparatus further comprises:
a sensor configured to detect whether a position of at least a part of the object alignment part is a first reference position or a second reference position; and
a processor configured to control, according to detection results of the sensor, the imaging part to acquire the first X-ray image when at least a part of the alignment part is positioned at the first reference position and to acquire the second X-ray image when the at least a part of the alignment part is positioned at the second reference position.