US 11,910,692 B2
Display device including test element group, and method for inspecting defect of display device
Seunghyun Park, Seoul (KR); and Yun-Mo Chung, Yongin-si (KR)
Assigned to SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do (KR)
Filed by Samsung Display Co., Ltd., Yongin-Si (KR)
Filed on Aug. 31, 2021, as Appl. No. 17/462,705.
Claims priority of application No. 10-2020-0162198 (KR), filed on Nov. 27, 2020.
Prior Publication US 2022/0173172 A1, Jun. 2, 2022
Int. Cl. H10K 59/88 (2023.01); G01R 31/28 (2006.01); H10K 50/822 (2023.01); H10K 71/00 (2023.01); H10K 50/828 (2023.01); H10K 59/12 (2023.01)
CPC H10K 59/88 (2023.02) [G01R 31/2884 (2013.01); H10K 50/822 (2023.02); H10K 71/00 (2023.02); H10K 50/828 (2023.02); H10K 59/12 (2023.02); H10K 59/1201 (2023.02)] 13 Claims
OG exemplary drawing
 
1. A display device comprising:
a substrate including a display area and a test area adjacent to the display area;
a lower electrode disposed in the display area on the substrate;
a light emitting layer disposed on the lower electrode;
a common layer disposed on the light emitting layer;
an upper electrode disposed on the common layer; and
a test element group including:
a plurality of electrode patterns disposed in a same layer as the lower electrode and in the test area on the substrate;
a test common layer disposed in a same layer as the common layer and on the plurality of electrode patterns, wherein a plurality of openings is defined through the test common layer to expose a part of each of the plurality of electrode patterns; and
an electrode layer disposed in a same layer as the upper electrode, on the test common layer, and in contact with the plurality of electrode patterns through the plurality of openings.