US 11,909,399 B2
System and semiconductor device therein
Tsung-Che Lu, Tainan (TW); Chin-Ming Fu, Hsinchu County (TW); and Chih-Hsien Chang, New Taipei (TW)
Assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., Hsinchu (TW)
Filed by TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., Hsinchu (TW)
Filed on May 31, 2022, as Appl. No. 17/828,834.
Prior Publication US 2023/0387897 A1, Nov. 30, 2023
Int. Cl. H03K 5/00 (2006.01); H03K 5/01 (2006.01); H03K 3/037 (2006.01); G06F 1/06 (2006.01); H03K 19/20 (2006.01)
CPC H03K 5/01 (2013.01) [G06F 1/06 (2013.01); H03K 3/037 (2013.01); H03K 19/20 (2013.01); H03K 2005/00013 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system, comprising:
a measuring device configured to measure a voltage difference between a first node and a second node;
a processing device coupled between the first node and the second node; and
a signal generating device configured to provide a first clock signal to the processing device to adjust the voltage difference, configured to generate the first clock signal according to a first enable signal and a second clock signal, and configured to align an edge of the first enable signal with an edge of the second clock signal.