US 11,906,677 B2
Methods of recovering radiation detector
Peiyan Cao, Shenzhen (CN); and Yurun Liu, Shenzhen (CN)
Assigned to SHENZHEN XPECTVISION TECHNOLOGY CO., LTD., Shenzhen (CN)
Filed by SHENZHEN XPECTVISION TECHNOLOGY CO., LTD., Shenzhen (CN)
Filed on Mar. 2, 2022, as Appl. No. 17/684,887.
Application 17/684,887 is a continuation of application No. 16/919,758, filed on Jul. 2, 2020, granted, now 11,294,081.
Application 16/919,758 is a continuation of application No. PCT/CN2018/075179, filed on Feb. 3, 2018.
Prior Publication US 2022/0268951 A1, Aug. 25, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G01T 1/24 (2006.01); G01J 1/44 (2006.01); G01T 1/17 (2006.01); G06F 21/30 (2013.01); H01L 27/146 (2006.01)
CPC G01T 1/247 (2013.01) [G01J 1/44 (2013.01); G01T 1/17 (2013.01); G06F 21/30 (2013.01); H01L 27/14614 (2013.01); H01L 27/14659 (2013.01); H01L 27/14661 (2013.01)] 17 Claims
OG exemplary drawing
 
12. An apparatus comprising:
an electronic system comprising a transistor, the transistor comprising a gate insulator with positive charge carriers accumulated therein due to exposure of the gate insulator to radiation; and
a processor configured to remove the positive charge carriers from the gate insulator by establishing an electric field across the gate insulator.