CPC G01R 31/2886 (2013.01) [G01R 1/06738 (2013.01); G01R 3/00 (2013.01)] | 20 Claims |
1. A contact assembly for a testing system for testing integrated circuit devices, comprising:
a first blade;
a second blade; and
an elastomer configured to retain the first blade and the second blade,
wherein the first blade and the second blade are electrically conductive,
the first blade and the second blade are arranged in a cross configuration so that the first blade and the second blade form a substantially X-shape in a top view when assembled,
the elastomer is at least columnar in part and non-conductive, and
the elastomer is configured to provide a rotational bias force to twist arms of the first blade and the second blade on the X-shape formed by the first blade and the second blade.
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