US 11,906,576 B1
Contact assembly array and testing system having contact assembly array
Valts Treibergs, White Bear Township, MN (US); Max A. Carideo, Plymouth, MN (US); David Skodje, Minneapolis, MN (US); and Melissa Hasskamp, Minneapolis, MN (US)
Assigned to JOHNSTECH INTERNATIONAL CORPORATION, Minneapolis, MN (US)
Filed by Johnstech International Corporation, Minneapolis, MN (US)
Filed on Apr. 27, 2022, as Appl. No. 17/730,391.
Claims priority of provisional application 63/183,742, filed on May 4, 2021.
Int. Cl. G01R 31/28 (2006.01); G01R 1/067 (2006.01); G01R 3/00 (2006.01)
CPC G01R 31/2886 (2013.01) [G01R 1/06738 (2013.01); G01R 3/00 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A contact assembly for a testing system for testing integrated circuit devices, comprising:
a first blade;
a second blade; and
an elastomer configured to retain the first blade and the second blade,
wherein the first blade and the second blade are electrically conductive,
the first blade and the second blade are arranged in a cross configuration so that the first blade and the second blade form a substantially X-shape in a top view when assembled,
the elastomer is at least columnar in part and non-conductive, and
the elastomer is configured to provide a rotational bias force to twist arms of the first blade and the second blade on the X-shape formed by the first blade and the second blade.