US 11,906,412 B2
Particle characterisation
Jason Corbett, Malvern (GB); and Alex Malm, Malvern (GB)
Assigned to Malvern Panalytical Limited, Malvern (GB)
Filed by Malvern Panalytical Limited, Malvern (GB)
Filed on Nov. 19, 2021, as Appl. No. 17/531,021.
Application 17/531,021 is a continuation of application No. 16/496,027, granted, now 11,199,486, previously published as PCT/EP2018/057033, filed on Mar. 20, 2018.
Claims priority of application No. 17162676 (EP), filed on Mar. 23, 2017.
Prior Publication US 2022/0326128 A1, Oct. 13, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G01N 15/02 (2006.01)
CPC G01N 15/0211 (2013.01) [G01N 2015/0222 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A method of characterising particles in a sample, comprising:
obtaining a plurality of scattering measurements, each scattering measurement comprising a time series of measurements of scattered light from a detector, the scattered light produced by the interaction of an illuminating light beam with the sample;
identifying contaminated scattering measurements, in which a contaminant was contributing to the scattered light; and
determining a particle characteristic from scattering measurements that have not been identified as contaminated scattering measurements by:
determining an autocorrelation function for each scattering measurement that has not been identified as a contaminated scattering measurement;
combining the autocorrelation functions to produce an average autocorrelation function from which the particle characteristic is derived.