US 12,232,252 B2
Backplane, backlight source, illumination device and displaying device
Yongfei Li, Beijing (CN); Liuyue Yin, Beijing (CN); Haifeng Hu, Beijing (CN); Huan Liu, Beijing (CN); Mengmeng Li, Beijing (CN); Yuancheng Li, Beijing (CN); Yu Jiang, Beijing (CN); Qin Zeng, Beijing (CN); Zouming Xu, Beijing (CN); Jian Tian, Beijing (CN); Chunjian Liu, Beijing (CN); Xintao Wu, Beijing (CN); Jie Lei, Beijing (CN); Jie Wang, Beijing (CN); and Jianying Zhang, Beijing (CN)
Assigned to Hefei Xinsheng Optoelectronics Co., Ltd., Anhui (CN); and BOE Technology Group Co., Ltd., Beijing (CN)
Filed by Hefei Xinsheng Optoelectronics Technology Co., Ltd., Anhui (CN); and BOE Technology Group Co., Ltd., Beijing (CN)
Filed on Oct. 22, 2021, as Appl. No. 17/508,932.
Claims priority of application No. 202110190306.8 (CN), filed on Feb. 18, 2021.
Prior Publication US 2022/0264743 A1, Aug. 18, 2022
Int. Cl. H01L 29/45 (2006.01); H01L 33/62 (2010.01); H05K 1/02 (2006.01); H01L 25/075 (2006.01); H05K 1/18 (2006.01)
CPC H05K 1/0298 (2013.01) [H01L 33/62 (2013.01); G09G 2300/0426 (2013.01); H01L 25/0753 (2013.01); H05K 1/181 (2013.01); H05K 2201/09672 (2013.01); H05K 2201/10106 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A backplane, comprising:
a substrate;
a first metal trace layer disposed on a surface of the substrate;
an insulating layer disposed on a side, away from the substrate, of the first metal trace layer;
a second metal trace layer disposed on a side, away from the substrate, of the insulating layer, and an overlapping area existing between an orthographic projection of the second metal trace layer on the substrate and an orthographic projection of the first metal trace layer on the substrate; and
a barrier layer disposed between the first metal trace layer and the second metal trace layer and configured for preventing metals in the first metal trace layer and the second metal trace layer from migrating and growing towards each other;
wherein the barrier layer is disposed on a surface, close to the second metal trace layer, of the first metal trace layer.