US 12,231,927 B2
Variable arbitrary resampler method for base station test system
Pablo Perez Lara, St Neots (GB); and John Dominic Wilson, Welwyn Garden (GB)
Assigned to VIAVI Solutions Inc., Chandler, AZ (US)
Filed by VIAVI Solutions Inc., Chandler, AZ (US)
Filed on Jun. 28, 2022, as Appl. No. 17/851,455.
Prior Publication US 2023/0422062 A1, Dec. 28, 2023
Int. Cl. H04W 88/08 (2009.01); H04W 24/06 (2009.01)
CPC H04W 24/06 (2013.01) [H04W 88/08 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A base station test system, comprising:
one or more memories; and
one or more processors, communicatively coupled to the one or more memories, configured to:
determine a pair of input sample counter values associated with a pair of input shift registers of the base station test system;
determine a first pair of output sample times and a second pair of output sample times associated with one or more output sample periods of the base station test system;
determine, based on the pair of input sample counter values and one time of the first pair of output sample times and one time of the second pair of output sample times, that a pair of output sample values can be calculated;
cause, based on determining that the pair of output sample values can be calculated, the pair of output sample values to be calculated; and
cause the pair of output sample values to be provided to a component of the base station test system.