US 12,231,830 B2
System and method for analyzing surface features using a low-dimensional color space camera
Ruikang K. Wang, Seattle, WA (US); and Qinghua He, Seattle, WA (US)
Assigned to University of Washington, Seattle, WA (US)
Appl. No. 17/765,317
Filed by University of Washington, Seattle, WA (US)
PCT Filed Sep. 30, 2020, PCT No. PCT/US2020/053564
§ 371(c)(1), (2) Date Mar. 30, 2022,
PCT Pub. No. WO2021/067451, PCT Pub. Date Apr. 8, 2021.
Claims priority of provisional application 62/909,097, filed on Oct. 1, 2019.
Prior Publication US 2022/0329767 A1, Oct. 13, 2022
Int. Cl. H04N 9/67 (2023.01); A61B 5/00 (2006.01); A61B 5/145 (2006.01); A61B 5/1455 (2006.01); G06T 7/00 (2017.01); G06T 7/90 (2017.01); H04N 17/00 (2006.01); H04N 23/56 (2023.01)
CPC H04N 9/67 (2013.01) [A61B 5/14546 (2013.01); A61B 5/1455 (2013.01); A61B 5/443 (2013.01); A61B 5/4547 (2013.01); A61B 5/6898 (2013.01); G06T 7/0012 (2013.01); G06T 7/90 (2017.01); H04N 23/56 (2023.01); G06T 2207/10024 (2013.01); G06T 2207/10064 (2013.01); G06T 2207/30036 (2013.01); G06T 2207/30088 (2013.01); G06T 2207/30201 (2013.01); H04N 17/002 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A computer-implemented method of generating a visualization of wavelength-dependent surface characteristics, the method comprising:
receiving, by a computing device, an input image captured by a camera, wherein the input image includes information in a low-dimensional color space;
processing, by the computing device, the input image to determine spectrum band information in a high-dimensional color space that corresponds to the input image;
extracting, by the computing device, subtractive information representing a contribution of a background characteristic from the spectrum band information to obtain wavelength-dependent surface characteristic information representing a target characteristic; and
generating, by the computing device, the visualization using the wavelength-dependent surface characteristic information;
wherein extracting subtractive information includes:
multiplying a detected reflectance by a ratio that represents a proportion of reflectance caused by the target characteristic and the background characteristic in a first set of wavelength bands compared to a second set of wavelength bands.