| CPC H03H 9/02015 (2013.01) [H03H 3/02 (2013.01); H03H 9/02047 (2013.01); H03H 9/173 (2013.01); H03H 2003/025 (2013.01)] | 3 Claims |

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1. An RF filter system, comprising:
a plurality of bulk acoustic wave resonators arranged in a circuit, the circuit including a serial configuration of resonators and a parallel shunt configuration of resonators, the circuit having a circuit response corresponding to the serial configuration and the parallel configuration of the plurality of bulk acoustic wave resonators, each of the resonators of the plurality of resonators comprising:
a reflector;
a support member including a cavity region over the reflector;
a first electrode including tungsten overlying the reflector;
a piezoelectric film including crystalline aluminum scandium nitride overlapping the first electrode and overlying the reflector;
a second electrode including tungsten overlapping the piezoelectric film, overlapping the first electrode, and overlying the reflector; and
a passivation layer including silicon nitride overlying the second electrode, one or more portions of a surface of the support member of at least one resonator of the plurality of bulk acoustic wave resonators defining the cavity region and a portion of the first electrode of the at least one resonator being located within the cavity region defined by the surface of the support member, the support member including the cavity region being a first support member portion, the support member including a second support member portion, the reflector being located in the second support member portion, the first support member portion and the second support member portion including the same material,
wherein the circuit response of the circuit corresponding to the serial configuration and the parallel configuration of the plurality of resonators has a transmission loss from a pass band having a bandwidth corresponding to a thickness of at least one of the first electrode, the piezoelectric film, the second electrode, and the passivation layer.
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