US 12,230,988 B2
Constant current charging capacitor test
Adrian Mocanu, Langley (CA); Zeljko Zupanc, Vancouver (CA); Derrick Wilson, North Vancouver (CA); and Andrew Morning-Smith, Vancouver (CA)
Assigned to Intel Corporation, Santa Clara, CA (US)
Filed by Intel Corporation, Santa Clara, CA (US)
Filed on Jul. 23, 2021, as Appl. No. 17/383,865.
Prior Publication US 2021/0351595 A1, Nov. 11, 2021
Int. Cl. G11C 5/14 (2006.01); G11C 5/10 (2006.01); H02J 7/00 (2006.01); H02J 7/34 (2006.01)
CPC H02J 7/005 (2020.01) [G11C 5/10 (2013.01); G11C 5/14 (2013.01); G11C 5/141 (2013.01); G11C 5/145 (2013.01); H02J 7/007182 (2020.01); H02J 7/345 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A solid state drive (SSD) comprising:
a non-volatile memory (NVM); and
a power management subsystem coupled to the NVM, the power management subsystem comprising:
a capacitor,
a charge circuit coupled to the capacitor via a first switch, wherein the charge circuit is to apply a constant current to the capacitor, and wherein the constant current causes a linear voltage increase in the capacitor,
a boost stage coupled to the capacitor via a second switch, wherein the boost stage is separate from the charge circuit and is to charge the capacitor to a voltage that is greater than an input voltage, and
a measurement circuit coupled to the capacitor, wherein the measurement circuit is to determine a capacitance of the capacitor based on the constant current, a voltage change in the capacitor during the linear voltage increase, and a time change corresponding to the voltage change.