CPC H01L 29/7831 (2013.01) [H01L 29/401 (2013.01); H01L 29/66484 (2013.01); H01L 29/66492 (2013.01); H01L 29/6656 (2013.01); H01L 29/7835 (2013.01)] | 20 Claims |
1. A transistor structure, comprising:
a substrate;
a first gate extending along a longitudinal direction over the substrate, the first gate comprising a gate electrode, wherein the first gate has a first length along the longitudinal direction;
a second gate over the substrate and apart from the first gate, wherein the second gate has a second length along the longitudinal direction and a second width along a horizontal direction orthogonal to the longitudinal direction, wherein the second length is greater than the second width, and the second length substantially equals the first length;
a source region of a first conductivity type in the substrate, aligning to an edge in proximity to a side of the first gate, having a source length substantially equals the first length;
a P-type well surrounding the source region;
a drain region of the first conductivity type in the substrate, and having a drain length substantially equals the first length;
an N-type well surrounding the drain region, wherein the N-type well has an N-well length along the longitudinal direction, the N-well length is greater than the second length of the second gate, the second gate is entirely within a vertical projection area of the N-type well, and a bottom surface of the P-type well and a bottom surface of the N-type well are substantially at a same depth from the first gate;
wherein the drain length is measured from one edge of the drain region to an opposite edge of the drain region along the longitudinal direction;
the source length is measured from one edge of the source region to an opposite edge of the source region along the longitudinal direction;
the second length is measured from one side of the second gate to an opposite side of the second gate across the longitudinal direction;
the second width is measured from one edge of the second gate to an opposite edge of the second gate across the horizontal direction; and
the N-well length is measured from one side of the N-type well to an opposite side of the N-type well across the longitudinal direction.
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