US 12,230,671 B2
Semiconductor devices and methods for fabricating the same
Jung Min Park, Seoul (KR); Han Jin Lim, Seoul (KR); Kyoo Ho Jung, Seoul (KR); and Cheol Jin Cho, Hwaseong-si (KR)
Assigned to Samsung Electronics Co., Ltd., (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Aug. 26, 2021, as Appl. No. 17/412,393.
Claims priority of application No. 10-2021-0009158 (KR), filed on Jan. 22, 2021.
Prior Publication US 2022/0238641 A1, Jul. 28, 2022
Int. Cl. H01L 27/08 (2006.01); H01L 49/02 (2006.01)
CPC H01L 28/92 (2013.01) 16 Claims
OG exemplary drawing
 
1. A semiconductor device comprising:
a landing pad on a substrate;
a lower electrode on the landing pad and electrically connected to the landing pad;
a capacitor dielectric film that is on the lower electrode and includes both a tetragonal crystal system and an orthorhombic crystal system;
a first doping layer that is between the lower electrode and the capacitor dielectric film and includes a first metal, the first doping layer physically contacting the lower electrode;
an upper electrode on the capacitor dielectric film;
a supporter pattern that is on at least one side of the lower electrode, wherein side walls of the supporter pattern are in direct contact with side walls of the lower electrode and a part of the first doping layer, and wherein an uppermost surface of the supporter pattern is in direct contact with the capacitor dielectric film;
wherein the first doping layer includes the first metal in an amount of 2 at % to 10 at %; and
wherein an uppermost surface of the first doping layer and the uppermost surface of the supporter pattern are coplanar.