CPC H01L 24/13 (2013.01) [H01L 23/10 (2013.01); H01L 23/3733 (2013.01); H01L 23/49816 (2013.01); H01L 23/49827 (2013.01); H01L 24/05 (2013.01); H01L 24/11 (2013.01); H01L 24/16 (2013.01); H01L 24/45 (2013.01); H01L 24/48 (2013.01); H01L 25/0652 (2013.01); H01L 25/0657 (2013.01); H01L 2224/0401 (2013.01); H01L 2224/05647 (2013.01); H01L 2224/1132 (2013.01); H01L 2224/13147 (2013.01); H01L 2224/16227 (2013.01); H01L 2224/45147 (2013.01); H01L 2224/48227 (2013.01); H01L 2225/06513 (2013.01); H01L 2225/06517 (2013.01); H01L 2225/0652 (2013.01); H01L 2225/06541 (2013.01)] | 18 Claims |
1. An electronic assembly comprising:
an IC substrate;
a package substrate; and
a plurality of interconnects in direct or indirect contact with at least the IC substrate;
wherein each interconnect comprises a bulk copper matrix formed from fusion of copper nanoparticles or a reaction product formed from copper nanoparticles; and
wherein the bulk copper matrix has a nanoporosity of 2-15% and a pore size of about 50 nm to about 500 nm.
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