| CPC H01L 23/5286 (2013.01) [H01L 21/76877 (2013.01); H01L 23/53257 (2013.01); H01L 29/0649 (2013.01)] | 16 Claims |

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1. An integrated circuit comprising:
a first semiconductor substrate, the first semiconductor substrate being a bare semiconductor wafer;
a first dielectric layer on the first semiconductor substrate;
buried power rails accommodated in the first dielectric layer;
a second dielectric layer on the first dielectric layer and the buried power rails;
a third dielectric layer on the second dielectric layer;
a donor wafer on the third dielectric layer; and
a plurality of active devices, vias, and metal interconnects on or in the donor wafer.
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