| CPC H01L 21/565 (2013.01) [H01L 21/76802 (2013.01); H01L 23/3121 (2013.01); H01L 23/5226 (2013.01); H01L 23/5383 (2013.01); H01L 23/5386 (2013.01); H01L 24/09 (2013.01); H01L 24/17 (2013.01); H01L 25/18 (2013.01); H01L 2224/0231 (2013.01); H01L 2224/02375 (2013.01); H01L 2224/02381 (2013.01)] | 20 Claims |

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1. A structure comprising:
a reconstructed wafer comprising:
a plurality of device dies allocated as a plurality of groups, wherein the plurality of groups are identical to each other, and wherein the plurality of groups comprise a first device die group and a second device die group;
an encapsulant encapsulating the plurality of device dies therein; and
a plurality of redistribution lines over and electrically inter-coupling the first device die group and the second device die group, wherein the first device die group is closer to a first corner of the reconstructed wafer than all other groups in the plurality of groups, and the second device die group is closer to a second corner of the reconstructed wafer than all other groups in the plurality of groups; and
a thermal module attached to the reconstructed wafer.
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