US 12,230,329 B2
Flash memory device and data recover read method thereof
Eunhyang Park, Suwon-si (KR); Joonsuc Jang, Suwon-si (KR); Se Hwan Park, Suwon-si (KR); and Ji-Sang Lee, Suwon-si (KR)
Assigned to Samsung Electronics Co., Ltd., (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Sep. 26, 2022, as Appl. No. 17/953,003.
Claims priority of application No. 10-2021-0154263 (KR), filed on Nov. 10, 2021; and application No. 10-2022-0066610 (KR), filed on May 31, 2022.
Prior Publication US 2023/0142279 A1, May 11, 2023
Int. Cl. G11C 16/08 (2006.01); G11C 16/10 (2006.01); G11C 16/28 (2006.01); G11C 16/34 (2006.01)
CPC G11C 16/102 (2013.01) [G11C 16/08 (2013.01); G11C 16/28 (2013.01); G11C 16/3404 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A flash memory device comprising:
a memory cell array connected with a plurality of word lines including a selected word line, a previous word line on which programming is performed before the selected word line, and a next word line on which programming is performed after the selected word line; and
control logic configured to:
perform threshold voltage compensation on the plurality of word lines through a data recover read operation,
determine that the next word line is a dummy word line,
in response to determining that the next word line is a dummy word line, set the previous word line as an aggressor word line,
perform a data recover read operation on the aggressor word line, and
perform the threshold voltage compensation on the selected word line based on a result of the data recover read operation of the aggressor word line.