US 12,229,489 B2
System and method of verifying slanted layout components
Yuan-Te Hou, Hsinchu (TW); and Min-Yuan Tsai, Hsinchu County (TW)
Assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., Hsinchu (TW)
Filed by Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu (TW)
Filed on Nov. 21, 2023, as Appl. No. 18/516,499.
Application 18/516,499 is a division of application No. 17/396,519, filed on Aug. 6, 2021, granted, now 11,861,288.
Prior Publication US 2024/0086613 A1, Mar. 14, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. G06F 30/39 (2020.01); G06F 30/31 (2020.01); G06F 30/392 (2020.01); G06F 30/398 (2020.01)
CPC G06F 30/398 (2020.01) [G06F 30/31 (2020.01); G06F 30/392 (2020.01)] 20 Claims
OG exemplary drawing
 
1. A non-transitory computer readable medium storing instructions that when executed by one or more processors cause the one or more processors to:
detect a slanted layout component having a side slanted from a base axis by an offset angle,
detect a first location of a vertex of the slanted layout component,
rotate the slanted layout component according to the offset angle to obtain a rotated layout component, wherein the rotated layout component has a rotated side in parallel with the base axis,
transform the first location of the vertex of the slanted layout component according to the offset angle to obtain a second location of the rotated vertex of the rotated layout component, and
perform layout verification on the rotated layout component with respect to the base axis.