US 12,229,485 B2
Assist apparatus, design assist method, design assist system, and computer readable medium
Takaya Higa, Tokyo (JP); and Taisuke Fujita, Tokyo (JP)
Assigned to Asahi Kasei Microdevices Corporation, Tokyo (JP)
Filed by Asahi Kasei Microdevices Corporation, Tokyo (JP)
Filed on Dec. 1, 2021, as Appl. No. 17/457,243.
Claims priority of application No. 2020-200192 (JP), filed on Dec. 2, 2020.
Prior Publication US 2022/0171909 A1, Jun. 2, 2022
Int. Cl. G06F 30/337 (2020.01); G06F 30/33 (2020.01); G06F 119/08 (2020.01)
CPC G06F 30/337 (2020.01) [G06F 30/33 (2020.01); G06F 2119/08 (2020.01)] 18 Claims
OG exemplary drawing
 
1. A design assist apparatus comprising:
an inputting unit configured to input an analysis condition including substrate information of a thermal analysis target and current detection element information; and
a display control unit configured to control a display unit to display, on the display unit, a thermal analysis result based on the analysis condition, wherein
the display control unit is configured to control the display unit to display, on the display unit and in a mutually identifiable manner, a first thermal analysis result based on a first analysis condition input by the inputting unit and a second thermal analysis result based on a second analysis condition obtained by changing at least one of the substrate information and the current detection element information from the first analysis condition;
the analysis condition further includes environment information of the thermal analysis target; and
the environment information includes at least one of a temperature of an environment of the thermal analysis target, a convection heat transfer coefficient of the environment, and a radiation heat transfer coefficient of the environment; and
a setting unit configured to set an output form of the thermal analysis result from a thermal analysis by a thermal analysis unit, wherein:
the inputting unit is configured to input first information and second information different from the first information which are selected from among the substrate information, the current detection element information, and the environment information;
the setting unit is configured to set the output form to a form representing a relationship between the first information and the second information; and
the display control unit is configured to control the display unit to display, on the display unit and in the form set by the setting unit, the first thermal analysis result and the second thermal analysis result.