US 12,229,024 B2
Memory system failure detection and self recovery of memory dice
Robert Mason, Boise, ID (US); Scott A. Stoller, Boise, ID (US); Pitamber Shukla, Boise, ID (US); Kenneth W. Marr, Boise, ID (US); Chi Ming Chu, Boise, ID (US); and Hossein Afkhami, Berkeley, CA (US)
Assigned to MICRON TECHNOLOGY, INC., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Mar. 18, 2024, as Appl. No. 18/608,652.
Application 18/608,652 is a continuation of application No. 17/877,779, filed on Jul. 29, 2022, granted, now 11,966,303.
Claims priority of provisional application 63/348,297, filed on Jun. 2, 2022.
Prior Publication US 2024/0220375 A1, Jul. 4, 2024
Int. Cl. G06F 11/14 (2006.01); G06F 9/30 (2018.01)
CPC G06F 11/1471 (2013.01) [G06F 9/30098 (2013.01); G06F 11/1469 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method of error recovery, the method comprising:
retrieving a set of register values from a memory device;
issuing a reset command to the memory device;
detecting a re-initialized set of register values resulting from the memory device resetting;
comparing the set of register values with the re-initialized set of register values; and
triggering a self-recovery attempt in response to the comparison of the set of register values with the re-initialized set of register values.