US 12,228,611 B2
Signal path calibration of a hardware setting in a test and measurement instrument
Barton T. Hickman, Portland, OR (US)
Assigned to Tektronix, Inc.
Filed by Tektronix, Inc., Beaverton, OR (US)
Filed on Aug. 24, 2020, as Appl. No. 17/000,491.
Claims priority of provisional application 62/892,812, filed on Aug. 28, 2019.
Prior Publication US 2021/0063488 A1, Mar. 4, 2021
Int. Cl. G01R 31/3183 (2006.01); G01K 3/00 (2006.01); G01K 3/08 (2006.01); G06F 11/30 (2006.01)
CPC G01R 31/318307 (2013.01) [G01K 3/005 (2013.01); G01K 3/08 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A test and measurement instrument, comprising:
a user interface configured to receive instructions to perform a signal path calibration for a user-specific setting received from a user, the signal path calibration to characterize how hardware settings affect a channel used as the signal path prior to the channel being used for measurements;
a memory configured to store signal path calibration data; and
one or more processors configured to:
determine an actual signal path hardware setting for the user-specific setting for the channel by characterizing the channel;
determine an adjustment to adjust the actual signal path hardware setting for the channel to accurately represent the user-specific setting based upon the characterization,
adjust the actual signal path hardware setting by the adjustment, and
store the user-specific setting and the adjusted signal path hardware setting in the signal path calibration data.