US 12,228,448 B2
Optical detector module and a method for operating the same
Kai-Wei Chiu, Hsinchu County (TW); Chih-Wei Chen, Hsinchu County (TW); and Chih-Wei Yeh, Hsinchu County (TW)
Assigned to ARTILUX, INC., Menlo Park, CA (US)
Filed by Artilux, Inc., Menlo Park, CA (US)
Filed on Apr. 8, 2024, as Appl. No. 18/629,351.
Application 18/629,351 is a continuation of application No. 17/730,934, filed on Apr. 27, 2022, granted, now 11,976,965.
Claims priority of provisional application 63/270,018, filed on Oct. 20, 2021.
Claims priority of provisional application 63/183,064, filed on May 3, 2021.
Prior Publication US 2024/0255344 A1, Aug. 1, 2024
Int. Cl. G01J 1/02 (2006.01)
CPC G01J 1/029 (2013.01) [G01J 1/0204 (2013.01); G01J 1/0219 (2013.01); G01J 1/0228 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method for operating an optical detector module, comprising:
enabling, by a controller of the optical detector module, a first light source of a transmitter unit of the optical detector module to emit a first optical signal with a first peak wavelength;
acquiring, by a processor of the optical detector module, a first integral value from a receiver unit corresponding to the first optical signal;
in response to determining that the first integral value does not satisfy a first threshold condition, disabling, by the controller, the first light source of the transmitter unit of the optical detector module or lowering a detecting frequency of the receiver unit;
in response to determining that the first integral value satisfies the first threshold condition, enabling, by the controller, a second light source of the transmitter unit of the optical detector module to emit a second optical signal with a second peak wavelength, wherein the first peak wavelength is different from the second peak wavelength;
acquiring, by the processor, a second integral value from the receiver unit corresponding to the second optical signal; and
identifying, by the processor and based on a comparison between the first integral value and the second integral value, a material of a target.