US 12,226,245 B2
X-ray position tracking
Klaus Alfred Erhard, Hamburg (DE); Heiner Daerr, Hamburg (DE); Artur Sossin, Hamburg (DE); Axel Thran, Hamburg (DE); Bernhard Johannes Brendel, Norderstedt (DE); Christian Haase, Hamburg (DE); and Claas Bontus, Hamburg (DE)
Assigned to KONINKLIJKE PHILIPS N.V., Eindhoven (NL)
Appl. No. 18/017,143
Filed by KONINKLIJKE PHILIPS N.V., Eindhoven (NL)
PCT Filed Jul. 16, 2021, PCT No. PCT/EP2021/070004
§ 371(c)(1), (2) Date Jan. 20, 2023,
PCT Pub. No. WO2022/023082, PCT Pub. Date Feb. 3, 2022.
Claims priority of application No. 20188576 (EP), filed on Jul. 30, 2020.
Prior Publication US 2023/0263487 A1, Aug. 24, 2023
Int. Cl. A61B 6/12 (2006.01); A61B 6/00 (2006.01)
CPC A61B 6/12 (2013.01) [A61B 6/4441 (2013.01); A61B 6/52 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A spectral X-ray imaging system comprising:
an X-ray source and an X-ray detector configured to generate spectral image data representing attenuation of X-rays traversing an imaging region between the X-ray source and the X-ray detector, for each of three or more energy intervals of the X-rays;
a support structure is configured to rotate the X-ray source and the X-ray detector around two or more orthogonal axes; and
one or more processors configured to:
generate a spectral image based on the spectral image data,
identify, in the spectral image, a position of a first fiducial marker comprising a first material, based on a first X-ray absorption k-edge energy value of the first material, and
identify, in the spectral image, a position of a second fiducial marker comprising a second material, based on a second X-ray absorption k-edge energy value of the second material, the second X-ray absorption k-edge energy value being different to the first X-ray absorption k-edge energy value.