CPC H01L 29/94 (2013.01) [H01L 29/0607 (2013.01); H01L 29/66181 (2013.01)] | 20 Claims |
1. A method comprising:
implanting a first dopant having a first dopant type into a substrate to define a plurality of source/drain (S/D) regions;
implanting a second dopant having the first dopant type into the substrate to define a channel region between adjacent S/D regions of the plurality of S/D regions, wherein a dopant concentration of the second dopant in the channel region is less than half of a dopant concentration of the first dopant in each of the plurality of S/D regions;
forming a gate stack over the channel region; and
electrically coupling each of the plurality of S/D regions together.
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4. A method comprising:
implanting a first dopant into a substrate to form a plurality of source/drain (S/D) regions in the substrate;
electrically coupling each of the plurality of S/D regions together;
implanting a second dopant into the substrate to define a channel region, wherein the channel region is between adjacent S/D regions of the plurality of S/D regions, wherein the second dopant and the first dopant are p-type, and a concentration of the second dopant in the channel region is less than a concentration of the first dopant in each of the plurality of S/D regions;
forming a gate stack over the channel region; and
forming an n-well in the substrate, wherein the n-well extends under the channel region and the adjacent S/D regions of the plurality of S/D regions.
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