CPC H01L 29/78693 (2013.01) [H01L 29/6675 (2013.01); H01L 29/78618 (2013.01); H01L 29/78696 (2013.01)] | 19 Claims |
1. A thin film transistor comprising:
an active layer; and
a gate electrode spaced apart from the active layer and configured to have at least a portion overlapped with the active layer,
wherein the active layer includes:
a silicon semiconductor layer; and
an oxide semiconductor layer which contacts the silicon semiconductor layer,
wherein at least a portion of the silicon semiconductor layer and at least a portion of the oxide semiconductor layer are overlapped with the gate electrode, and
wherein the silicon semiconductor and the oxide semiconductor layer are not overlapped with each other in a thickness direction.
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