CPC H01L 21/28518 (2013.01) [H01L 21/67213 (2013.01); H01L 21/67739 (2013.01); H01L 21/76876 (2013.01)] | 13 Claims |
1. A system for fabricating a metal oxide semiconductor field effect transistor (MOSFET) device, comprising:
a transfer chamber defining a transfer space;
an n-type metal oxide semiconductor (NMOS) chamber, a p-type metal oxide semiconductor (PMOS) chamber, a pre-clean chamber, a metal-silicide deposition chamber, and a plasma chamber, wherein each of the NMOS chamber, the PMOS chamber, the pre-clean chamber, the metal-silicide deposition chamber, and the plasma chamber is coupled to the transfer chamber, and the NMOS and PMOS chambers are each source-drain epitaxy chambers;
a transfer robot in the transfer space configured to access the transfer chamber, the NMOS chamber, the PMOS chamber, the pre-clean chamber, the metal-silicide deposition chamber, and the plasma chamber; and
a controller comprising instructions for device fabrication, wherein, when executed by a processor, the instructions cause the system to:
retrieve a substrate from the transfer chamber;
dispose the substrate in the NMOS chamber, the PMOS chamber, or the plasma chamber;
perform at least one pre-silicide treatment on the substrate to increase a concentration of a dopant within the substrate or to increase a surface roughness of the substrate, the at least one pre-silicide treatment comprising soaking the substrate in one or more precursor sources;
transfer the substrate into the metal-silicide deposition chamber; and
subsequently, form, by deposition, a metal-silicide on the substrate in the metal-silicide deposition chamber.
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