US 11,900,666 B2
Defect detection and image comparison of components in an assembly
Yan Zhou, Mountain View, CA (US); George Huang, Los Altos Hills, CA (US); and Jisheng Li, Los Altos, CA (US)
Assigned to Future Dial, Inc., Sunnyvale, CA (US)
Filed by Future Dial, Inc., Sunnyvale, CA (US)
Filed on Jan. 6, 2023, as Appl. No. 18/151,386.
Application 18/151,386 is a continuation of application No. 16/882,203, filed on May 22, 2020, granted, now 11,551,349.
Prior Publication US 2023/0162495 A1, May 25, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G06T 7/00 (2017.01); G06V 10/75 (2022.01); G06V 10/98 (2022.01)
CPC G06V 10/98 (2022.01) [G06T 7/001 (2013.01); G06V 10/759 (2022.01); G06T 2200/24 (2013.01); G06T 2207/30108 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system, comprising:
a processing device configured to:
compare, for a component of a test assembly, a plurality of portions of an image taken of the test assembly to a corresponding plurality of portions of a corresponding profile image;
compute, based on the comparing, a set of matching scores for the plurality of portions of the image and the corresponding plurality of portions of the corresponding profile image;
select a largest matching score from the set of matching scores to be a component matching score for the component.