US 11,899,510 B2
Breakaway tab for debugger connector access
Boon Khian Foo, Singapore (SG)
Assigned to MICRON TECHNOLOGY, INC., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Apr. 28, 2022, as Appl. No. 17/731,603.
Prior Publication US 2023/0350469 A1, Nov. 2, 2023
Int. Cl. G06F 1/18 (2006.01)
CPC G06F 1/181 (2013.01) 20 Claims
OG exemplary drawing
 
1. A memory enclosure comprising:
a debugger connector access portion in the memory enclosure;
a breakaway tab, wherein the breakaway tab at least partially covers the debugger connector access portion;
at least two anchoring joints connecting the breakaway tab to a portion of the memory enclosure surrounding the debugger connector access portion, the anchoring joints adapted to break upon application of a breaking force causing the breakaway tab to break away from the memory enclosure and allow a debugger tool access through an exterior of the memory enclosure to a debugger connector situated in an interior of the memory enclosure; and
a support bar situated behind the breakaway tab on a bottom portion of the breakaway tab, wherein the support bar acts as a pivot point while the breaking force is applied.