US 11,899,058 B2
Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipment
Marc Mössinger, Renningen (DE)
Assigned to Advantest Corporation, Tokyo (JP)
Filed by Advantest Corporation, Tokyo (JP)
Filed on Nov. 14, 2022, as Appl. No. 17/986,780.
Application 17/986,780 is a division of application No. 17/086,079, filed on Oct. 30, 2020, granted, now 11,500,013.
Application 17/086,079 is a continuation of application No. PCT/EP2020/053055, filed on Feb. 6, 2020.
Claims priority of provisional application 62/949,918, filed on Dec. 18, 2019.
Prior Publication US 2023/0087389 A1, Mar. 23, 2023
Int. Cl. G01R 1/02 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/26 (2020.01); G01R 31/28 (2006.01)
CPC G01R 31/2889 (2013.01) [G01R 1/06722 (2013.01); G01R 31/2834 (2013.01)] 19 Claims
OG exemplary drawing
 
1. An automated test equipment for testing one or more devices under test, the automated test equipment comprising:
a device-under-test interface comprising a plurality of blocks of spring-loaded pins configured to electrically contact a device-under-test board;
a hinge;
a test head configured to couple said device-under-test interface to a test instrument,
wherein at, least one block or spring-loaded pins of the plurality of blocks or spring-loaded pins is guided using the hinge, and
wherein a distance between a first and a second block of the plurality of blocks of spring-loaded pins is adjustable.