US 11,898,962 B2
Method and system for determining the location of artefacts and/or inclusions in a gemstone, mineral, or sample thereof
Roland Fleddermann, Bruce (AU); Jong Hann Chow, Bonner (AU); Adrian Paul Sheppard, Fisher (AU); Timothy John Senden, Acton (AU); Shane Jamie Latham, Griffith (AU); and Keshu Huang, Turner (AU)
Assigned to The Australian National University, Acton (AU)
Appl. No. 16/977,622
Filed by The Australian National University, Acton (AU)
PCT Filed Mar. 4, 2019, PCT No. PCT/AU2019/050182
§ 371(c)(1), (2) Date Sep. 2, 2020,
PCT Pub. No. WO2019/165514, PCT Pub. Date Sep. 6, 2019.
Claims priority of application No. 2018900677 (AU), filed on Mar. 2, 2018.
Prior Publication US 2021/0041369 A1, Feb. 11, 2021
Int. Cl. G01N 21/00 (2006.01); G01N 21/87 (2006.01); G06T 7/73 (2017.01); G06T 7/521 (2017.01); G01B 9/02091 (2022.01); G01B 11/00 (2006.01); G01B 11/30 (2006.01); G01N 21/88 (2006.01); G01N 23/046 (2018.01); G01N 23/083 (2018.01); G01N 33/38 (2006.01)
CPC G01N 21/87 (2013.01) [G01B 9/02091 (2013.01); G01B 11/005 (2013.01); G01B 11/30 (2013.01); G01N 21/8851 (2013.01); G01N 23/046 (2013.01); G01N 23/083 (2013.01); G01N 33/381 (2013.01); G06T 7/521 (2017.01); G06T 7/74 (2017.01); G01N 2021/8861 (2013.01); G01N 2223/04 (2013.01); G01N 2223/3304 (2013.01); G01N 2223/419 (2013.01); G01N 2223/646 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10101 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A method for determining a location of artefacts and/or inclusions in a gemstone, mineral or sample thereof, the method comprising the steps of:
surface mapping a gemstone, mineral or sample thereof to determine surface geometry associated with at least a portion of a surface of the gemstone, mineral or sample thereof;
sub-surface mapping the gemstone, mineral or sample thereof using an optical beam that is directed at the surface along an optical beam path, wherein the optical beam is generated by an optical source using an optical tomography process;
determining a surface normal at the surface at an intersection point between the optical beam path and the determined surface geometry;
determining relative positioning between the surface normal and the optical beam path;
determining the location of artefacts and/or inclusions in the gemstone, mineral or sample thereof based on the sub-surface mapping step and the determined relative positioning; and
wherein, based on the determined relative positioning, during the sub-surface mapping of the gemstone, mineral or sample thereof, the gemstone, mineral or sample thereof, and the optical beam are moved relative to each other to cause the optical beam path to be substantially in line with the surface normal where the optical beam path intersects with the surface.