CPC H10N 50/10 (2023.02) [G11C 11/161 (2013.01); G11C 11/1697 (2013.01); H01F 10/3286 (2013.01); H10B 61/00 (2023.02); H10N 50/80 (2023.02); H10N 50/85 (2023.02)] | 20 Claims |
1. A memory device, comprising:
a first electrode;
a second electrode; and
a magnetic tunnel junction located between the first electrode and the second electrode and comprising:
a reference layer;
a free layer;
a nonmagnetic tunnel barrier layer located between the reference layer and the free layer; and
a platinum-containing layer comprising platinum and at least one element selected from iridium, hafnium or ruthenium, wherein the platinum-containing layer contacts the free layer.
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