US 12,224,762 B2
Measurement unit configured to provide a measurement result value
Andreas Beermann, Stuttgart (DE)
Assigned to Advantest Corporation, Tokyo (JP)
Filed by Advantest Corporation, Tokyo (JP)
Filed on Apr. 29, 2022, as Appl. No. 17/733,427.
Application 17/733,427 is a continuation of application No. PCT/EP2020/062795, filed on May 7, 2020.
Prior Publication US 2022/0263517 A1, Aug. 18, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. H03M 1/50 (2006.01); G04F 10/00 (2006.01); H03M 1/06 (2006.01); H03M 1/10 (2006.01)
CPC H03M 1/0658 (2013.01) [G04F 10/005 (2013.01); H03M 1/1071 (2013.01)] 36 Claims
OG exemplary drawing
 
1. An apparatus for providing, a measurement result value based on a first input signal and a second input signal the apparatus comprising:
a measurement unit comprising a converter unit and a processing unit;
wherein the converter unit is configured:
to provide first values, wherein the first values are based on one of: the first input signal; and the first input signal and the second input signal; and
to provide second values, wherein the second values are based on one of: the second input signal; and the first input signal and the second input signal, and wherein quantization step sizes of a first value of the first values and a second value of the second values are based on one or more control signals of the converter unit,
wherein the measurement unit is configured to change the one or more control signals of the converter unit between a determination of different first values or performing a determination of different second values, and wherein the different first values or the different second values are provided based on different converter quantization step sizes; and
wherein the processing unit is configured to provide the measurement result value from a predefined number of first values and a predefined number of second values, wherein effects of the quantization step sizes on the first and second values cancels out.