US 12,224,759 B2
Apparatus and method for calibrating mismatches of time-interleaved analog-to-digital converter
Jaerin Lee, Yongin-si (KR); Yang Azevedo Tavares, Gwangju (KR); Minjae Lee, Gwangju (KR); and Kyeongkeun Kang, Suwon-si (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR); and GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY, Gwangju (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Jul. 12, 2022, as Appl. No. 17/863,167.
Claims priority of application No. 10-2021-0090898 (KR), filed on Jul. 12, 2021.
Prior Publication US 2023/0011449 A1, Jan. 12, 2023
Int. Cl. H03M 1/10 (2006.01); H03M 1/06 (2006.01)
CPC H03M 1/0604 (2013.01) 19 Claims
OG exemplary drawing
 
1. An apparatus comprising:
a time-interleaved analog-to-digital converter configured to receive a non-return-to-zero (NRZ) signal in a correction mode and generate a first output signal, and comprising a plurality of analog-to-digital converters; and
a mismatch corrector configured to generate a second output signal by processing the first output signal from the time-interleaved analog-to-digital converter based on parameters,
wherein the parameters are generated based on the first output signal of the time-interleaved analog-to-digital converter in the correction mode, and
wherein the NRZ signal is a pulse signal having a period different from a product of a sampling period of the time-interleaved analog-to-digital converter and a number of the plurality of analog-to-digital converters comprised in the time-interleaved analog-to-digital converter.