| CPC H01L 25/0652 (2013.01) [H01L 21/568 (2013.01); H01L 23/3128 (2013.01); H01L 23/3135 (2013.01); H01L 23/5383 (2013.01); H01L 23/5385 (2013.01); H01L 25/50 (2013.01)] | 20 Claims |

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1. A structure comprising:
a stack of semiconductor devices, each of the semiconductor devices comprising:
trench capacitors on a substrate; and
through vias extending through the substrate, the through vias being electrically coupled to the trench capacitors;
first conductive connectors between each of the semiconductor devices of the stack of semiconductor devices, the first conductive connectors mechanically and electrically bonding the adjacent semiconductor devices together;
underfill between the adjacent semiconductor devices and surrounding the first conductive connectors;
a first encapsulant on sidewalls of the stack of semiconductor devices and the underfill; and
second conductive connectors electrically coupled to a lowermost semiconductor device of the stack of semiconductor devices, the second conductive connectors being on an opposite side of the lowermost semiconductor device as the first conductive connectors.
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