| CPC H01L 23/3135 (2013.01) [H01L 23/3142 (2013.01); H01L 24/05 (2013.01); H01L 24/42 (2013.01); H01L 24/44 (2013.01); H01L 24/45 (2013.01); H01L 24/47 (2013.01); H01L 24/48 (2013.01); H01L 25/0655 (2013.01); H01L 25/072 (2013.01); H01L 25/18 (2013.01); H02M 7/5387 (2013.01); H01L 23/293 (2013.01); H01L 23/296 (2013.01); H01L 2224/05573 (2013.01); H01L 2224/05624 (2013.01); H01L 2224/4501 (2013.01); H01L 2224/45124 (2013.01); H01L 2224/45147 (2013.01); H01L 2224/45155 (2013.01); H01L 2224/45157 (2013.01); H01L 2224/4516 (2013.01); H01L 2224/45599 (2013.01); H01L 2224/4569 (2013.01); H01L 2224/48137 (2013.01); H01L 2224/48175 (2013.01); H01L 2924/1811 (2013.01); H01L 2924/1815 (2013.01); H01L 2924/182 (2013.01); H01L 2924/186 (2013.01); H01L 2924/35121 (2013.01); H02M 1/08 (2013.01)] | 13 Claims |

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1. A semiconductor module comprising:
a first power semiconductor device including a first electrode;
a conductive wire joined to a first surface of the first electrode; and
a resin film formed to be continuous on a first end portion of a first joint between the first electrode and the conductive wire in a longitudinal direction of the conductive wire, the first surface of the first electrode, and a second surface of the conductive wire,
wherein the resin film has an elastic elongation rate of 4.5% to 10.0%.
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