US 12,224,168 B2
Mass spectrometer and mass spectrometry method
Takuma Nishimoto, Tokyo (JP); Zihao Ong, Tokyo (JP); Isao Furuya, Tokyo (JP); Hiroshi Touda, Tokyo (JP); Yuichiro Hashimoto, Tokyo (JP); and Masuyuki Sugiyama, Tokyo (JP)
Assigned to HITACHI HIGH-TECH CORPORATION, Tokyo (JP)
Appl. No. 17/795,355
Filed by Hitachi High-Tech Corporation, Tokyo (JP)
PCT Filed Dec. 2, 2020, PCT No. PCT/JP2020/044929
§ 371(c)(1), (2) Date Jul. 26, 2022,
PCT Pub. No. WO2021/157175, PCT Pub. Date Aug. 12, 2021.
Claims priority of application No. 2020-016216 (JP), filed on Feb. 3, 2020.
Prior Publication US 2023/0056978 A1, Feb. 23, 2023
Int. Cl. H01J 49/00 (2006.01)
CPC H01J 49/0009 (2013.01) 13 Claims
OG exemplary drawing
 
1. A mass spectrometer for analyzing a sample, the mass spectrometer comprising:
a frame which is a container having conductivity;
a needle provided in the frame;
an electrode provided apart from the needle in the frame;
a detector configured to detect an ion amount based on electrons that are emitted from an ionized sample generated based on the sample;
a controller configured to display a current amount measured by the detector;
a first power supply configured to apply a first voltage to the needle;
a second power supply configured to apply a second voltage to the electrode;
a first current detection unit connected in series between a ground of the first power supply and the frame; and
a second current detection unit connected in series between a ground of the second power supply and the frame, wherein
the controller respectively determines presence or absence of first electric discharge between the needle and a component of an ion source other than the electrode and presence or absence of second electric discharge between the needle and the electrode based on current amounts respectively measured by the first current detection unit and the second current detection unit.