| CPC G11C 11/4074 (2013.01) [G11C 11/4076 (2013.01); G11C 11/4085 (2013.01); G11C 11/4094 (2013.01); G11C 11/5628 (2013.01); G11C 11/5642 (2013.01); G06F 3/0688 (2013.01); G06F 11/1072 (2013.01); G11C 5/147 (2013.01); G11C 7/12 (2013.01); G11C 8/08 (2013.01); G11C 16/0483 (2013.01)] | 17 Claims |

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1. A semiconductor memory device comprising:
a memory cell;
a word line connected to a gate of the memory cell;
a bit line connected to the memory cell;
a first transistor connected to the bit line; and
a control circuit configured to perform a read operation on the memory cell,
wherein the control circuit is configured to, during the read operation,
apply to the word line a first voltage, then a second voltage greater than the first voltage at a first timing, and then a third voltage smaller than the second voltage at a second timing after the first timing, and
apply to a gate of the first transistor a fourth voltage, then a fifth voltage at a third timing after the first timing and before the second timing, and then a sixth voltage that is higher than the fourth voltage and lower than the fifth voltage at a fourth timing after the second timing.
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