US 12,223,684 B2
Neural network based physical condition evaluation of electronic devices, and associated systems and methods
John Silva, San Diego, CA (US); and Babak Forutanpour, San Diego, CA (US)
Assigned to ecoATM, LLC, San Diego, CA (US)
Filed by ecoATM, LLC, San Diego, CA (US)
Filed on Sep. 22, 2023, as Appl. No. 18/472,994.
Application 18/472,994 is a continuation of application No. 16/794,009, filed on Feb. 18, 2020, granted, now 11,798,250.
Claims priority of provisional application 62/807,165, filed on Feb. 18, 2019.
Prior Publication US 2024/0087276 A1, Mar. 14, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. G06V 10/141 (2022.01); G02B 27/30 (2006.01); G06N 3/08 (2023.01); G06Q 30/0283 (2023.01); G06T 7/00 (2017.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); H04N 23/56 (2023.01)
CPC G06V 10/141 (2022.01) [G02B 27/30 (2013.01); G06N 3/08 (2013.01); G06Q 30/0283 (2013.01); G06T 7/0004 (2013.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); H04N 23/56 (2023.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30108 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system for evaluating a condition of an electronic device, the system comprising:
a kiosk that includes:
one or more cameras configured to capture at least one image of a first side of the electronic device; and
one or more processors in communication with the one or more cameras, the one or more processors configured to:
apply a first machine learning model to the at least one image of the electronic device,
wherein the first machine learning model is trained to output, based on analyzing the at least one image, a brand and/or model of the electronic device and a cosmetic rating of the electronic device specific to the brand and/or model;
determine the condition of the electronic device based on the cosmetic rating; and
determine, via a second machine learning model, an offer price for the electronic device based on the determined condition,
wherein the second machine learning model is different from the first machine learning model.