US 12,223,635 B2
Test support method, test support device, and storage medium
Maho Fujihara, Tokyo (JP); Daisuke Tateishi, Tokyo (JP); Hideo Nakata, Tokyo (JP); Shiho Adachi, Tokyo (JP); Keisuke Sugihara, Tokyo (JP); Shota Shimayoshi, Tokyo (JP); and Atsushi Takami, Tokyo (JP)
Assigned to Mitsubishi Electric Corporation, Tokyo (JP)
Appl. No. 17/787,387
Filed by Mitsubishi Electric Corporation, Tokyo (JP)
PCT Filed Jan. 29, 2020, PCT No. PCT/JP2020/003212
§ 371(c)(1), (2) Date Jun. 20, 2022,
PCT Pub. No. WO2021/152735, PCT Pub. Date Aug. 5, 2021.
Prior Publication US 2023/0015988 A1, Jan. 19, 2023
Int. Cl. G06T 7/00 (2017.01); B61L 27/60 (2022.01); G06V 10/44 (2022.01); G06V 10/762 (2022.01); G06V 10/764 (2022.01)
CPC G06T 7/0004 (2013.01) [B61L 27/60 (2022.01); G06V 10/44 (2022.01); G06V 10/763 (2022.01); G06V 10/764 (2022.01); G06T 2200/24 (2013.01); G06T 2207/30121 (2013.01); G06V 2201/02 (2022.01)] 16 Claims
OG exemplary drawing
 
1. A test support method comprising:
obtaining a pre-change image and a post-change image, each to be displayed on a monitoring and control system;
extracting, from the post-change image, a plurality of symbols that have changed from corresponding symbols in the pre-change image;
adding order information defined by numerals to the plurality of the extracted symbols within the post-change image consecutively in one direction; and
outputting a test image in which the order information is added to the plurality of symbols.