US 12,223,582 B2
Iterative ray-tracing for autoscaling of oblique ionograms
Geoffrey Crowley, Lafayette, CO (US); Timothy M. Duly, Westminster, CO (US); Clive Winkler, Superior, CO (US); and Syed Irfan Azeem, Louisville, CO (US)
Assigned to Atmospheric & Space Technology Research Associates, L.L.C., Louisville, CO (US)
Filed by Atmospheric & Space Technology Research Associates, L.L.C., Louisville, CO (US)
Filed on Jan. 16, 2023, as Appl. No. 18/097,432.
Application 18/097,432 is a division of application No. 15/553,169, granted, now 11,557,079, previously published as PCT/US2016/019570, filed on Feb. 25, 2016.
Claims priority of provisional application 62/120,854, filed on Feb. 25, 2015.
Prior Publication US 2023/0206545 A1, Jun. 29, 2023
Int. Cl. G06T 15/06 (2011.01); G06T 11/20 (2006.01)
CPC G06T 15/06 (2013.01) [G06T 11/206 (2013.01); G06T 2215/16 (2013.01)] 4 Claims
OG exemplary drawing
 
1. A method of iterative ray tracing, comprising the steps of:
transmitting, from a transmitter at a first location, a swept signal into a portion of the ionosphere;
receiving, at a receiver positioned at a second location, a reflection of the swept signal;
at a computing system connected to the receiver:
receiving a first input comprising data indicative of an oblique incidence (OI) ionogram based on the reflection of the swept signal;
reducing at least one of noise and other spurious signals in the data to programmatically produce a first output comprising first output data;
autoscaling the first output data to programmatically produce a second output comprising data indicative of a substantially separated O-trace and an X-trace;
iteratively processing the second output to programmatically predict the electron density profile over a measurement region associated with the portion of the ionosphere, wherein iteratively processing the second output comprises:
determining a vertical incidence (VI) ionogram based on the second output;
determining an initial electron density profile based on the VI ionogram;
determining a constructed OI ionogram based on the initial electron density profile;
determining that a difference between the constructed ionogram and second output exceeds a threshold; and
adjusting one or more parameters of the initial electron density profile based on the difference between the constructed ionogram and second output; and
outputting a predicted electron density profile.