US 12,222,321 B2
Apparatus for inspecting a tube and method of inspecting a tube using the apparatus
Wongoo Choi, Suwon-si (KR)
Assigned to Samsung Electronics Co., Ltd., Gyeonggi-Do (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Dec. 9, 2022, as Appl. No. 18/064,065.
Claims priority of application No. 10-2022-0060643 (KR), filed on May 18, 2022.
Prior Publication US 2023/0375505 A1, Nov. 23, 2023
Int. Cl. G01N 27/90 (2021.01); B23K 31/12 (2006.01)
CPC G01N 27/9006 (2013.01) [B23K 31/125 (2013.01)] 16 Claims
OG exemplary drawing
 
1. An apparatus for inspecting a tube, the apparatus comprising:
a first probe holder configured to hold a first portion of the tube, the first probe holder including,
a first holding block,
a plurality of first holding rollers rotatably connected to an inner surface of the first holding block with respect to the axial direction of the tube, the plurality of first holding rollers configured to support the first portion of the tube, and
a receiving groove, the receiving groove perpendicular to the axial direction of the tube, the receiving groove including an opening between the inner surface of the first holding block and an outer surface of the first holding block opposite the inner surface;
a second probe holder rotatably connected to the first probe holder with respect to an axial direction of the tube, the second probe holder configured to hold a second portion of the tube; and
an eddy current sensor on the receiving groove of the first probe holder, the eddy current sensor configured to inspect at least one welding portion of the tube using at least one eddy current, the receiving groove being between a pair of first holding rollers among the plurality of the first holding rollers, and the eddy current sensor being exposed to the tube via the opening of the receiving groove.