US 12,222,263 B2
Automated functional testing systems and methods of making and using the same
Myung Ki Kim, Mckinney, TX (US)
Assigned to Kyutaek Cho
Filed by Kyutaek Cho, Saddle River, NJ (US)
Filed on Apr. 6, 2023, as Appl. No. 18/131,400.
Application 18/131,400 is a continuation of application No. 16/629,574, granted, now 11,709,114, previously published as PCT/US2018/026430, filed on Apr. 6, 2018.
Claims priority of provisional application 62/482,199, filed on Apr. 6, 2017.
Prior Publication US 2023/0296481 A1, Sep. 21, 2023
Int. Cl. G01M 99/00 (2011.01); B25J 9/16 (2006.01); B65G 61/00 (2006.01); G01L 25/00 (2006.01); G01R 31/28 (2006.01); G03B 43/00 (2021.01); G06F 3/041 (2006.01); G06F 11/263 (2006.01); G06F 11/267 (2006.01); G06F 11/273 (2006.01); G10K 11/16 (2006.01); G10L 25/51 (2013.01); H04N 17/00 (2006.01); H04R 29/00 (2006.01)
CPC G01M 99/005 (2013.01) [B25J 9/161 (2013.01); B25J 9/1674 (2013.01); B65G 61/00 (2013.01); G01L 25/00 (2013.01); G01M 99/008 (2013.01); G01R 31/2834 (2013.01); G03B 43/00 (2013.01); G06F 3/0416 (2013.01); G06F 11/263 (2013.01); G06F 11/267 (2013.01); G06F 11/273 (2013.01); G06F 11/2733 (2013.01); G10K 11/16 (2013.01); G10L 25/51 (2013.01); H04N 17/002 (2013.01); H04R 29/001 (2013.01); H04R 29/004 (2013.01)] 7 Claims
OG exemplary drawing
 
1. An automated method for functional testing of test devices, said method comprising: loading, using a touch screen panel (“TSP”) load/unload robot, a test device present on a TSP conveyor to a TSP testing jig present in a TSP load/unload region of a TSP testing subsystem;
displacing, using a TSP testing shuttle that has secured thereon said TSP testing jig, said test device from said TSP load/unload region to a TSP test region of said TSP testing subsystem;
testing, using a TSP robot, TSP functionalities of said test device;
displacing, using said TSP testing shuttle, said test device from said TSP test region to said TSP load/unload region;
conveying, using said TSP load/unload robot, said test device from said TSP testing jig to a TSP unload conveyor, if said test device passes said testing of TSP functionalities;
removing, using said TSP load/unload robot, said test device from said TSP testing jig to a TSP reject conveyor, if said test device fails said testing of TSP functionalities,
advancing said test device from said TSP unload conveyor to a camera load conveyor of a camera testing subsystem, if said test device passes said testing of TSP functionalities;
loading, using a camera load/unload robot, a test device present on said camera load conveyor to a camera testing jig present in a camera load/unload region of said camera testing subsystem;
displacing, using a camera testing shuttle that has secured thereon said camera testing jig, said test device from said camera load/unload region to a camera test region of said camera testing subsystem;
testing, using a camera robot, camera functionalities of said test device;
displacing, using said camera testing shuttle, said test device from said camera test region to said camera load/unload region;
conveying, using said camera load/unload robot, said test device from said camera testing jig to a camera unload conveyor, if said test device passes said testing of camera functionalities;
removing, using said camera load/unload robot, said test device from said camera testing jig to a camera reject conveyor, if said test device fails said testing of camera functionalities;
advancing said test device from said camera unload conveyor to an audio load conveyor of an audio testing subsystem, if said test device passes said testing of camera functionalities;
loading, using an audio load/unload robot, a test device present on said audio load conveyor to an audio testing jig present in an audio load/unload region of said camera testing subsystem;
displacing, using an audio testing shuttle that has secured thereon said audio testing jig, said test device from said audio load/unload region to an audio test region of said audio testing subsystem;
testing, using an audio robot, audio functionalities of said test device;
displacing, using said audio testing shuttle, said test device from said audio test region to said audio load/unload region;
conveying, using said audio load/unload robot, said test device from said audio testing jig to an audio unload conveyor, if said test device passes said testing of audio functionalities; and
removing, using said audio load/unload robot, said test device from said audio testing jig to an audio reject conveyor, if said test device fails said testing of audio functionalities.