CPC H10N 70/841 (2023.02) [G11C 13/0004 (2013.01); G11C 13/0007 (2013.01); H10B 63/10 (2023.02); H10N 70/021 (2023.02); H10N 70/883 (2023.02)] | 18 Claims |
1. A semiconductor device comprising:
a substrate;
a plurality of first electrode structures extending in a first direction on a top surface of the substrate, the plurality of first electrode structures having a longest dimension in the first direction, the plurality of first electrode structures being arranged in a second direction crossing the first direction;
a second electrode pattern extending in the second direction, a first portion of the second electrode pattern being disposed on the substrate, a second portion of the second electrode pattern being disposed on a top surface of each of the plurality of first electrode structures and on a sidewall of each of the plurality of first electrode structures; and
a data storage film overlapping a side surface of the second electrode pattern in the first direction, the side surface facing a direction parallel to the first direction,
wherein the data storage film has a variable resistance,
wherein the data storage film includes a first horizontal portion on a surface of the substrate, a second vertical portion on the sidewall of the first electrode structures, and the second vertical portion on the sidewall of the second electrode pattern,
wherein the data storage film includes a third horizontal portion on an upper surface of the first electrode structure, and
the data storage film includes a fourth horizontal portion on the top surface of the second electrode pattern.
|